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JKI's FPGA-based Scanning E-Beam Wafer Instrument Project Featured in Xilinx Blog

Sep 28, 2017 2:32:42 PM Published by JKI Leave a comment
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We're pleased to announce that JKI's PDF Solutions case study has been featured in the Xilinx blog. This article showcases a recent project where we helped our customer develop an fpga-based e-beam wafer instrument that combines a scanning electron microscope (SEM) and optical microscope. This is also very exciting, since JKI recently joined the Xilinx Alliance Program, expanding its capabilities in deliving high-powered fpga-based solutions to its customers.

 

Read the Xilinx Blog Article Here

 

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Tags: consulting, fpga, LabVIEW, Xilinx

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